Optimization of Ferroelectric SELBOX TFET and Ferroelectric SOI TFET
Author:
Funder
CSIR-EMR-II
Publisher
The Electrochemical Society
Subject
Electronic, Optical and Magnetic Materials
Link
https://iopscience.iop.org/article/10.1149/2162-8777/ab697e/pdf
Reference28 articles.
1. Physics-based surface potential, electric field and drain current model of aδp+Si1–xGexgate–drain underlap nanoscale n-TFET
2. Optimisation of electrical parameters in Fe DS-SBTFET and its application as a digital inverter
3. Double-Gate Tunnel FET With High-$\kappa$ Gate Dielectric
4. A comparative study of radio frequency stability performance of Double Gate MOSFET and Double Gate Tunnel FET
5. Short-channel effect in fully depleted SOI MOSFETs
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. InAs Raised Buried Oxide SOI-TFET with N-type Si1-xGex Pocket for Low-Power Applications;Nanoelectronic Devices and Applications;2024-06-26
2. Performances of gate stacked heterojunction SELBOX and SOI tunnel FETs including interface trap charges: A simulation study;Materials Science and Engineering: B;2024-02
3. Heterostructure performance evaluation: A numerical simulation and analytical modeling of the ferroelectric pocket doped double gate tunnel FET;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2023-10-28
4. Dependence of RF/analog and linearity parameters on ferroelectric layer thickness in ferroelectric tunnel junction dual material double gate (FTJ-DMDG) TFET;Ferroelectrics;2023-01-02
5. Comparative analysis of Change plasma and Junctionless Ferroelectric tunneling junction of VTFET for improved performance;Silicon;2022-07-21
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3