Author:
Takada Yoko,Tsuji Toru,Okamoto Naoki,Saito Takeyasu,Kondo K.,Yoshimura Takeshi,Fujimura Norifumi,Higuchi Koji,Kitajima Akira,Oshima Akihiro
Abstract
PbLaZrTiOx(PLZT) thin films were fabricated on Pt(111) substrateby the sol-gel method for ferroelectric capacitors. Pt top electrodeswere deposited by sputtering, aluminum-doped zinc oxide (AZO)or indium tin oxide (ITO) top electrodes were deposited by pulsedlaser deposition (PLD) on PLZT capacitors. We compared bothdegradation characteristics by annealing in 200°C, 1Torr, 3%hydrogen atmosphere and fatigue properties, exhibited the PLZTcapacitors with AZO and ITO top electrodes has better propertiescompared to the PLZT capacitors with Pt top electrodes.
Publisher
The Electrochemical Society
Cited by
4 articles.
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