An Extended Unified Schottky-Poole-Frenkel Theory to Explain the Current-Voltage Characteristics of Thin Film Metal-Insulator-Metal Capacitors with Examples for Various High-k Dielectric Materials-Reference-Cited by-同舟云学术

An Extended Unified Schottky-Poole-Frenkel Theory to Explain the Current-Voltage Characteristics of Thin Film Metal-Insulator-Metal Capacitors with Examples for Various High-k Dielectric Materials

Published:2012 Issue:6 Volume:1 Page:N139-N148
ISSN:2162-8769
Container-title:ECS Journal of Solid State Science and Technology
language:en
Short-container-title:ECS J. Solid State Sci. Technol.

Author:

Lau W. S.

Publisher

The Electrochemical Society

Subject

Electronic, Optical and Magnetic Materials

Reference48 articles.

1. VIII. On the dielectric constant and electrical conductivity of mica in intense fields

2. On Pre-Breakdown Phenomena in Insulators and Electronic Semi-Conductors

3. The Poole‐Frenkel Effect with Compensation Present

4. Reasons for obtaining an optical dielectric constant from the Poole–Frenkel conduction behavior of atomic-layer-deposited HfO[sub 2] films

5. Mechanisms of Difficulty to Correlate the Leakage Current of High-k Capacitor Structures with Defect States Detected Spectroscopically by the Thermally Stimulated Current Technique

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