An efficient reliability estimation method for CNTFET‐based logic circuits

Author:

Jahanirad Hadi1ORCID,Hosseini Mostafa1

Affiliation:

1. Department of Electrical Engineering University of Kurdistan Sanandaj Iran

Publisher

Wiley

Subject

Electrical and Electronic Engineering,General Computer Science,Electronic, Optical and Magnetic Materials

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Quantum Insights into Dielectric Materials and Oxide Thickness-Dependent Conductance in Single-Walled CNTFET: A Parametric Simulation Study;2024 International Conference on Advances in Computing, Communication, Electrical, and Smart Systems (iCACCESS);2024-03-08

2. Characterizing CNTFET Logic Gate and Adder Performance Trade-offs by considering CNT Tube Diameter and Dielectric Constant;2023 IEEE 9th International Women in Engineering (WIE) Conference on Electrical and Computer Engineering (WIECON-ECE);2023-11-25

3. Logic Circuits Reliability Analysis using Signal Probability and Bayesian Network Concepts;Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering);2023-02

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