Characterizing CNTFET Logic Gate and Adder Performance Trade-offs by considering CNT Tube Diameter and Dielectric Constant
Author:
Affiliation:
1. Ahsanullah Uniersity of Science & Technology,Department of Electrical & Electronic Engineering,Dhaka,Bangladesh
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10456368/10456369/10456438.pdf?arnumber=10456438
Reference19 articles.
1. A Compact SPICE Model for Carbon-Nanotube Field-Effect Transistors Including Nonidealities and Its Application—Part I: Model of the Intrinsic Channel Region
2. Carbon Nanotube Field-Effect Transistors with Integrated Ohmic Contacts and High-κ Gate Dielectrics
3. Self-Aligned Ballistic Molecular Transistors and Electrically Parallel Nanotube Arrays
4. Carbon nanotubes for microelectronics: status and future prospects
5. An efficient reliability estimation method for CNTFET‐based logic circuits
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