Синтез легкотестируемых схем в базисе Жегалкина при константных неисправностях типа 0 на выходах элементов
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Steklov Mathematical Institute
Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Оценка длин тестов в базисе Жегалкина при константных неисправностях типа «1» на выходах элементов;Дискретная математика;2024
2. Some classes of circuits in Zhegalkin basis admitting short tests;Proceedings of Academician O.B. Lupanov 14th International Scientific Seminar "Discrete Mathematics and Its Applications";2022
3. The Length of a Single Fault Detection Test for Constant-Nonpreserving Element Insertions;Computational Mathematics and Modeling;2020-10
4. Short Complete Fault Detection Tests for Logic Networks with Fan-In Two;Journal of Applied and Industrial Mathematics;2019-01
5. Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates;Journal of Applied and Industrial Mathematics;2018-04
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