Abstract
This paper outlines some features of diffraction instrumental monitoring (DIM), a method which can prove helpful to evaluate systematic effects from diffraction measurements and facilitate the comparison of results. The work provides some consideration of the significance of the information contained in diffraction patterns and the ability of DIM methods to yield the effective values of instrumental parameters obtained under working conditions.
Publisher
Cambridge University Press (CUP)
Subject
Condensed Matter Physics,Instrumentation,General Materials Science,Radiation
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