-Reference-Cited by-同舟云学术

Binary and phase-shifting image design for optical lithography

Author:

Liu Yong,Zakhor Avideh

Publisher

SPIE

Cited by 29 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Curvilinear mask metrology: what is the equivalent critical dimension?;Journal of Micro/Nanopatterning, Materials, and Metrology;2024-06-27

2. Make the impossible possible: use variable-shaped beam mask writers and curvilinear full-chip inverse lithography technology for 193i contacts/vias with mask-wafer co-optimization;Journal of Micro/Nanopatterning, Materials, and Metrology;2024-02-06

3. Breakthrough curvilinear ILT enabled by multi-beam mask writing;Journal of Micro/Nanopatterning, Materials, and Metrology;2021-11-17

4. Inverse lithography technology: 30 years from concept to practical, full-chip reality;Journal of Micro/Nanopatterning, Materials, and Metrology;2021-08-31

5. Mask Optimization based on artificial desired pattern;2020 International Workshop on Advanced Patterning Solutions (IWAPS);2020-11-05

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