Author:
Suzuki Makoto,Kameda Toshimasa,Doi Ayumi,Borisov Sergey,Babin Sergey
Reference41 articles.
1. Scanning Electron Microscopy, Physics of Image Formation;Reimer,1998
2. Monte Carlo Modeling for Electron Microscopy and Microanalysis;Joy,1995
3. Monte Carlo simulation of electron scattering in resist film/substrate target;Murata,1984
4. Energy loss functions derived by Monte Carlo simulation from the Au 4f XPS spectrum
5. Surface and Interface Analysis
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