Analyses of tabulated optical constants for thin films in the EUV range and application to solar physics multilayer coatings-Reference-Cited by-同舟云学术

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Analyses of tabulated optical constants for thin films in the EUV range and application to solar physics multilayer coatings

Published:2018-06-05 Issue: Volume: Page:
ISSN:
Container-title:Advances in Optical Thin Films VI
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Author:

Rebellato Jennifer,de Rossi Sébastien,Zhang Xueyan,Auchère Frédéric,Meltchakov Evgueni,Delmotte Franck,Soufli Regina

Publisher

SPIE

Reference35 articles.

1. The SOHO Mission

2. B4C/Mo/Si multilayers for 20-40 nm wavelengths: application to broadband mirrors;Delmotte,2005

3. Development of multilayer coatings for solar orbiter EUV imaging telescopes

4. EUV multilayer coatings for solar imaging and spectroscopy

5. IMD—Software for modeling the optical properties of multilayer films

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1. Experimental study and modeling of extreme ultraviolet 4000 lines/mm diffraction gratings coated with periodic and aperiodic Al/Mo/SiC multilayers;Applied Optics;2023-12-21

2. Nested Sampling aided determination of tantalum optical constants in the EUV spectral range;Applied Optics;2022-11-17

3. Al/Mo/SiC multilayer diffraction gratings with broadband efficiency in the extreme ultraviolet;Optics Express;2022-09-30

4. New method for the determination of photoabsorption from transmittance measurements in the extreme ultraviolet;Optics Express;2022-06-15

5. Embedded Micro-detectors for EUV Exposure Control in FinFET CMOS Technology;Nanoscale Research Letters;2022-01-05

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