-Reference-Cited by-同舟云学术

Yield enhancement with DFM

Author:

Paek Seung Weon,Kang Jae Hyun,Ha Naya,Kim Byung-Moo,Jang Dae-Hyun,Jeon Junsu,Kim DaeWook,Chung Kun Young,Yu Sung-eun,Park Joo Hyun,Bae SangMin,Song DongSup,Noh WooYoung,Kim YoungDuck,Song HyunSeok,Choi HungBok,Kim Kee Sup,Choi Kyu-Myung,Choi Woonhyuk,Jeon JoongWon,Lee JinWoo,Kim Ki-Su,Park SeongHo,Chung No-Young,Lee KangDuck,Hong YoungKi,Kim BongSeok

Publisher

SPIE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A new era DFM solution for yield enhancement using machine learning (ML);DTCO and Computational Patterning III;2024-04-10

2. Design for manufacturability for analog, radio frequency, and millimeter wave designs;Design-Process-Technology Co-optimization for Manufacturability XIII;2019-03-20

3. High coverage of litho hotspot detection by weak pattern scoring;SPIE Proceedings;2015-03-18

4. Topology-oriented pattern extraction and classification for synthesizing lithography test patterns;Journal of Micro/Nanolithography, MEMS, and MOEMS;2015-01-23

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