Neural fault diagnosis techniques for nonlinear analog circuit
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SPIE
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Calculating Signal Controllability using Neural Networks: Improvements to Testability Analysis and Test Point Insertion;2020 IEEE 29th North Atlantic Test Workshop (NATW);2020-06
2. A Modular Fault-Diagnostic System for Analog Electronic Circuits Using Neural Networks With Wavelet Transform as a Preprocessor;IEEE Transactions on Instrumentation and Measurement;2007-10
3. Modularity, Self-Organization and Complexity Estimation: Three Foremost Supplies toward Intelligent Information Processing;2005 IEEE Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications;2005-09
4. Fault diagnosis of nonlinear analog circuits using neural networks with wavelet and Fourier transforms as preprocessors;Journal of Electronic Testing;2001
5. Multi-neural network approach for classification of brainstem evoked response auditory;Lecture Notes in Computer Science;1999
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