10.1023/a:1012864504306

Author:

Aminian Farzan,Aminian Mehran

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Cited by 33 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Comprehensive Review of Machine Learning Applications in VLSI Testing: Unveiling the Future of Semiconductor Manufacturing;2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech);2023-12-18

2. AI/ML algorithms and applications in VLSI design and technology;Integration;2023-11

3. Integrated Damage Location Diagnosis of Frame Structure Based on Convolutional Neural Network with Inception Module;Sensors;2022-12-30

4. Research on Circuit Fault Diagnosis Method Based on Multi-feature Information Fusion;2022 13th International Conference on Reliability, Maintainability, and Safety (ICRMS);2022-08-21

5. Fault Testing and Diagnosis in Analog Circuits Using Fault Dictionary Techniques;Journal of Biomedical and Allied Research;2022-08-09

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