Author:
Immanuel Joshua,Millican Spencer K.
Cited by
3 articles.
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1. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04
2. An Amalgamated Testability Measure Derived from Machine Intelligence;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
3. Machine Learning and Its Applications in Test;Machine Learning Support for Fault Diagnosis of System-on-Chip;2023