Application of a positioning and measuring machine for metrological long-range scanning force microscopy-Reference-Cited by-同舟云学术

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Application of a positioning and measuring machine for metrological long-range scanning force microscopy

Published:2005-08-18 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Hausotte T.,Jaeger G.,Manske E.,Hofmann N.,Dorozhovets N.

Publisher

SPIE

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Optimal Design of a Dragonfly-Inspired Compliant Joint for Camera Positioning System of Nanoindentation Tester Based on a Hybrid Integration of Jaya-ANFIS;Mathematical Problems in Engineering;2018-07-26

4. Hybrid Taguchi-cuckoo search algorithm for optimization of a compliant focus positioning platform;Applied Soft Computing;2017-08

5. Novel control scheme for a high-speed metrological scanning probe microscope;Measurement Science and Technology;2011-08-08

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