The effect of deposition process parameters on thin film coatings for the Athena X-ray optics-Reference-Cited by-同舟云学术

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The effect of deposition process parameters on thin film coatings for the Athena X-ray optics

Published:2021-08-23 Issue: Volume: Page:
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Container-title:Optics for EUV, X-Ray, and Gamma-Ray Astronomy X
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Author:

Massahi Sonny,Ferreira Desiree D. M.,Christensen Finn E.,Gellert Nis C.,Svendsen Sara,Henriksen Peter L.,Jegers Arne S.,Collon Maximilien J.,Landgraf Boris,Girou David,Thete Aniket,Shortt Brian,Ferreira Ivo,Bavdaz Marcos,Schönberger Waldemar,Langer Axel

Publisher

SPIE

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bilayer and trilayer X-ray mirror coatings containing W, Pt, or Ir<?oxy_insert_start author="CKapler" timestamp="20231211T162235-0500"?>,<?oxy_insert_end?> in combination with C, C/Co, B₄C, or B₄C/Ni: X-ray reflectance, film stress, and temporal stability;Applied Optics;2023-12-11

2. The development of the mirror for the Athena X-ray mission;International Conference on Space Optics — ICSO 2022;2023-07-12

3. Coating process parameter influence on thin films for the ATHENA x-ray optics;Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray;2022-08-31

4. Dopamine dip-liquid overcoatings for soft x-ray reflectivity enhancement;Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray;2022-08-31

5. ATHENA optics technology development;Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray;2022-08-31

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