Affiliation:
1. Advanced Photon Source
2. Lawrence Berkeley National Laboratory
3. Physikalisch-Technische Bundesanstalt (PTB)
Abstract
X-ray reflectance and film
stress were measured for 12
bilayer and trilayer reflective interference coatings and compared
with a single-layer Ir coating. The interference coatings comprise a
base layer of W, Pt, or Ir, top layers of either C or B4C, and, in the case of the trilayer
coatings, middle layers of either Co or Ni. The coatings were
deposited by magnetron sputtering. Film stress was measured using the
wafer curvature technique, while X-ray reflectance was measured at
grazing incidence over the ∼0.1−10keV energy band using synchrotron
radiation. Re-measurements over a period of more than two years of
both stress and X-ray reflectance were used to assess temporal
stability. The X-ray reflectance of all 12 bilayer and trilayer
coatings was found to be both stable over time and substantially
higher than single-layer Ir over much of the energy range
investigated, particularly below ∼4keV, except near the B and C K-edges, and
the Co and Ni L-edges, where we observe sharp, narrow drops in
reflectance due to photo-absorption in layers containing these
materials. Film stress was found to be substantially smaller than
single-layer Ir in all cases as well; however, film stress was also
found to change over time for all coatings (including the single-layer
Ir coating). The effective area of future X-ray telescopes will be
substantially higher if these high reflectance bilayer and/or trilayer
coatings are used in place of single-layer coatings. Additionally, the
smaller film stresses found in the bilayer and trilayer coatings
relative to single-layer Ir will reduce coating-stress-driven mirror
deformations. Nevertheless, as all the interference films studied here
have stresses that are far from zero (albeit smaller than that of
single-layer Ir), methods to mitigate such deformations must be
developed in order to construct high-angular-resolution telescopes
using thin mirror segments. Furthermore, unless film stress can be
sufficiently stabilized over time, perhaps through thermal annealing,
any such mitigation methods must also account for the temporal
instability of film stress that was found in all coatings investigated
here.
Funder
National Aeronautics and Space
Administration
Subject
Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering
Cited by
2 articles.
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