Coating process parameter influence on thin films for the ATHENA x-ray optics-Reference-Cited by-同舟云学术

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Coating process parameter influence on thin films for the ATHENA x-ray optics

Published:2022-08-31 Issue: Volume: Page:
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Container-title:Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray
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Author:

Massahi Sonny,Ferreira Desiree D. M.,Christensen Finn,Svendsen Sara,Gellert Nis C.,'S Jegers Arne,Collon Maximilien J.,Landgraf Boris,Thete Aniket,Ferreira Ivo,Bavdaz Marcos,Shortt Brian,Schönberger Waldemar,Langer Axel,Krumrey Michael,Gollwitzer Christian,Handick Evelyn

Publisher

SPIE

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bilayer and trilayer X-ray mirror coatings containing W, Pt, or Ir<?oxy_insert_start author="CKapler" timestamp="20231211T162235-0500"?>,<?oxy_insert_end?> in combination with C, C/Co, B₄C, or B₄C/Ni: X-ray reflectance, film stress, and temporal stability;Applied Optics;2023-12-11

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