Trap-assisted tunneling in high permittivity gate dielectric stacks
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.373587
Reference17 articles.
1. Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin-oxide nMOSFET's
2. Non-Arrhenius temperature dependence of reliability in ultrathin silicon dioxide films
3. Electrical properties of Ta2O5 films obtained by plasma enhanced chemical vapor deposition using a TaF5 source
4. Electrical properties of (Zr,Sn)TiO4dielectric thin film prepared by pulsed laser deposition
5. MOSFET transistors fabricated with high permitivity TiO/sub 2/ dielectrics
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