The atomic structure and polarization of strained SrTiO3/Si-Reference-Cited by-同舟云学术

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The atomic structure and polarization of strained SrTiO3/Si

Published:2010-12-20 Issue:25 Volume:97 Page:251902
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Kumah D. P.,Reiner J. W.,Segal Y.,Kolpak A. M.,Zhang Z.,Su D.,Zhu Y.,Sawicki M. S.,Broadbridge C. C.,Ahn C. H.,Walker F. J.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3529460

Reference26 articles.

1. Crystalline Oxides on Silicon: The First Five Monolayers

2. Epitaxial perovskite thin films grown on silicon by molecular beam epitaxy

3. High-k Crystalline Gate Dielectrics: A Research Perspective

4. Growth and Novel Applications of Epitaxial Oxide Thin Films

5. Atomic structure of the interface between SrTiO3 thin films and Si(001) substrates

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual lattice;Ultramicroscopy;2023-11

2. First-Principles Investigation of Interfacial Reconstruction in Epitaxial SrTiO₃/Si Photocathodes;The Journal of Physical Chemistry C;2022-11-01

3. Effect of buffer termination on intermixing and conductivity in LaTiO3/SrTiO3 heterostructures integrated on Si(100);Journal of Vacuum Science & Technology A;2022-01

4. Tuning band alignment at a semiconductor-crystalline oxide heterojunction via electrostatic modulation of the interfacial dipole;Physical Review Materials;2021-10-08

5. High‐Resolution Crystal Truncation Rod Scattering: Application to Ultrathin Layers and Buried Interfaces;Advanced Materials Interfaces;2020-02-20

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