High‐Resolution Crystal Truncation Rod Scattering: Application to Ultrathin Layers and Buried Interfaces
Author:
Affiliation:
1. Condensed Matter DepartmentMax Planck Institute for the Structure and Dynamics of Matter 22761 Hamburg Germany
2. Department of Applied Physics and Center for Research on Interface Structures and PhenomenaYale University New Haven CT 06520 USA
Funder
Alexander von Humboldt-Stiftung
U.S. Department of Energy
Office of Science
Basic Energy Sciences
Publisher
Wiley
Subject
Mechanical Engineering,Mechanics of Materials
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/admi.201901772
Reference300 articles.
1. Picoscale materials engineering
2. Crystal truncation rods and surface roughness
3. Scattering of X-rays from crystal surfaces
4. Atomic Displacements at Surface of Si-Wafer(111)
5. High Resolution Investigation of the Rod-Shaped Scattering from a (111) Si Surface by a Synchrotron Radiation Source
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