The impact of defect scattering on the quasi-ballistic transport of nanoscale conductors-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

The impact of defect scattering on the quasi-ballistic transport of nanoscale conductors

Published:2015-02-28 Issue:8 Volume:117 Page:084319
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Esqueda I. S.¹,Cress C. D.²^ORCID,Cao Y.³,Che Y.³,Fritze M.¹,Zhou C.³

Affiliation:

1. Information Sciences Institute, University of Southern California, Marina del Rey, California 90292, USA

2. Electronics Science and Technology Division, Naval Research Laboratory, Washington, DC 20375, USA

3. Department of Electrical Engineering, University of Southern California, Los Angeles, California 90089, USA

Funder

Defense Threat Reduction Agency (DTRA)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4913779

Reference34 articles.

1. Elementary scattering theory of the Si MOSFET

2. Spatial Variation of Currents and Fields Due to Localized Scatterers in Metallic Conduction

3. Alternative Approach to the Solution of Added Carrier Transport Problems in Semiconductors

4. Electronic Transport in Mesoscopic Systems

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Band gap opening of metallic single-walled carbon nanotubes via noncovalent symmetry breaking;Proceedings of the National Academy of Sciences;2024-03-11

2. Effect of channel thickness on radiation hardness of solution-processed oxide thin film transistors;Journal of Materials Chemistry C;2023

3. Electron mobility distribution in FD-SOI MOSFETs using a NEGF-Poisson approach;Solid-State Electronics;2022-07

4. Cryogenic Characterization and Analysis of Nanoscale SOI FETs Using a Virtual Source Model;IEEE Transactions on Electron Devices;2022-03

5. Ambipolar transport compact models for two-dimensional materials based field-effect transistors;Tsinghua Science and Technology;2021-10

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3