Frequency dispersion in III-V metal-oxide-semiconductor capacitors
Author:
Funder
Office of Naval Research
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4724330
Reference30 articles.
1. Ultimate Scaling of CMOS Logic Devices with Ge and III–V Materials
2. Unified defect model and beyond
3. Mechanism of Fermi-level stabilization in semiconductors
4. Fundamentals of III-V Semiconductor MOSFETs
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