A density functional theory study on the passivation mechanisms of hydrogenated Si/Al2O3 interfaces-Reference-Cited by-同舟云学术

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A density functional theory study on the passivation mechanisms of hydrogenated Si/Al2O3 interfaces

Published:2020-01-21 Issue:3 Volume:127 Page:035301
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Colonna Francesco¹²,Kühnhold-Pospischil Saskia³,Elsässer Christian¹²^ORCID

Affiliation:

1. Freiburg Materials Research Center, Albert-Ludwigs-Universität Freiburg, Stefan-Meier-Straße 21, 79104 Freiburg, Germany

2. Fraunhofer Institute for Mechanics of Materials IWM, Wöhlerstraße 11, 79108 Freiburg, Germany

3. Fraunhofer Institute for Solar Energy Systems ISE, Heidenhofstraße 2, 79110 Freiburg, Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5123492

Reference64 articles.

1. High-κ gate dielectrics: Current status and materials properties considerations

2. Low-Temperature Al2O3 Atomic Layer Deposition

3. High dielectric constant gate oxides for metal oxide Si transistors

4. Remote Plasma and Thermal ALD of Al2O3 for Trench Capacitor Applications

5. Status and prospects of Al2O3-based surface passivation schemes for silicon solar cells

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of the medium-temperature light soaking process on the passivation and electronic performance of the N-TOPCon solar cells;Solar Energy Materials and Solar Cells;2024-08

2. Hybrid density functional theory study on zinc blende GaN and diamond surfaces and interfaces: Effects of size, hydrogen passivation, and dipole corrections;Computational Condensed Matter;2022-03

3. Atomistic calculations of charged point defects at grain boundaries in SrTiO3;Physical Review B;2021-08-18

4. Subnanoscale Investigation of the Interface Between c-Si and PECVD AlOx and Its Effect on Surface Passivation;IEEE Journal of Photovoltaics;2021-05

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