Pattern level assembly of Ge quantum dots on Si with focused ion beam templating
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2957676
Reference23 articles.
1. Realization of a Functional Cell for Quantum-Dot Cellular Automata
2. Lithographic positioning of self-assembled Ge islands on Si(001)
3. Controlled arrangement of self-organized Ge islands on patterned Si (001) substrates
4. Ordered nucleation of Ge islands along high index planes on Si
5. Two-dimensional periodic alignment of self-assembled Ge islands on patterned Si(001) surfaces
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1. Roadmap for focused ion beam technologies;Applied Physics Reviews;2023-12-01
2. In Situ Transmission Electron Microscopy;Springer Handbook of Microscopy;2019
3. Directed Self-Assembly of Ge Quantum Dots Using Focused Si2+ Ion Beam Patterning;Scientific Reports;2018-06-19
4. Ion implantation for deterministic single atom devices;Review of Scientific Instruments;2017-12
5. Parametric analysis of mechanically driven compositional patterning in SiGe substrates;Journal of Applied Physics;2017-02-14
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