Depth-resolved soft x-ray photoelectron emission microscopy in nanostructures via standing-wave excited photoemission-Reference-Cited by-同舟云学术

Depth-resolved soft x-ray photoelectron emission microscopy in nanostructures via standing-wave excited photoemission

Published:2008-12-15 Issue:24 Volume:93 Page:243116
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Kronast F.,Ovsyannikov R.,Kaiser A.,Wiemann C.,Yang S.-H.,Bürgler D. E.,Schreiber R.,Salmassi F.,Fischer P.,Dűrr H. A.,Schneider C. M.,Eberhardt W.,Fadley C. S.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3046782

Reference11 articles.

1. Investigating surface magnetism by means of photoexcitation electron emission microscopy

2. Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins

3. Spin Reorientation at the Antiferromagnetic NiO(001) Surface in Response to an Adjacent Ferromagnet

4. Vortex Core-Driven Magnetization Dynamics

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Emergent phenomena at oxide interfaces studied with standing-wave photoelectron spectroscopy;Journal of Vacuum Science & Technology A;2022-03

2. High resolution depth profiling using near-total-reflection hard x-ray photoelectron spectroscopy;Journal of Vacuum Science & Technology A;2021-12

3. Chemical and structural characterization of EUV photoresists as a function of depth by standing-wave x-ray photoelectron spectroscopy;Journal of Micro/Nanopatterning, Materials, and Metrology;2021-07-21

4. Sub-nm depth characterization of EUV nanoscale photoresist films by standing-wave photoemission spectroscopy;Extreme Ultraviolet Lithography 2020;2020-11-10

5. Correlative microscopy of morphology and luminescence of Cu porphyrin aggregates;Journal of Physics B: Atomic, Molecular and Optical Physics;2018-06-18