A system for measuring deep‐level spatial concentration distributions
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.329965
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1. A microcomputer based deep level transient spectroscopy system;Solid State Communications;1991-10
2. Major Implantation‐Induced Defects in Conventional and Rapid Annealed, Silicon Implanted LEC‐Grown GaAs;Journal of The Electrochemical Society;1991-01-01
3. A new correlation method for improvement in selectivity of bulk trap measurements from capacitance and voltage transients;Review of Scientific Instruments;1990-04
4. Deep level transient spectroscopy analysis of spatially dependent doping profiles;Journal of Applied Physics;1990-01
5. Introduction of defect levels in resistive‐evaporatedn‐Si Schottky barrier diodes;Journal of Applied Physics;1989-05-15
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