Response to “Comment on ‘Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale’” [Rev. Sci. Instrum. 95, 067101 (2024)]
Author:
Affiliation:
1. Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois , Urbana, Illinois 61801, USA
Publisher
AIP Publishing
Link
https://pubs.aip.org/aip/rsi/article-pdf/doi/10.1063/5.0216146/19995320/067102_1_5.0216146.pdf
Reference21 articles.
1. Comment on ‘Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale’ [Rev. Sci. Instrum. 94, 014903 (2023)];Rev. Sci. Instrum.,2024
2. Measurement of thermal properties of bulk materials and thin films by modulated thermoreflectance (MTR);J. Appl. Phys.,2020
3. Photothermal displacement spectroscopy: An optical probe for solids and surfaces;Appl. Phys. A,1983
4. Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale;Rev. Sci. Instrum.,2023
5. Thermal-wave detection and thin-film thickness measurements with laser beam deflection;Appl. Opt.,1983
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