Comment on “Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale” [Rev. Sci. Instrum. 94, 014903 (2023)]
Author:
Affiliation:
1. INSP, Sorbonne Université, UFR 925 , 75005 Paris, France
Publisher
AIP Publishing
Link
https://pubs.aip.org/aip/rsi/article-pdf/doi/10.1063/5.0220820/19994060/067101_1_5.0220820.pdf
Reference5 articles.
1. Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale
2. Photothermal displacement spectroscopy: An optical probe for solids and surfaces
3. Thermal-wave detection and thin-film thickness measurements with laser beam deflection
4. Measurement of thermal properties of bulk materials and thin films by modulated thermoreflectance (MTR)
5. Photothermal deflection spectroscopy and detection
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1. Response to “Comment on ‘Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale’” [Rev. Sci. Instrum. 95, 067101 (2024)];Review of Scientific Instruments;2024-06-01
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