Atomic force microscopy study of plastic deformation and interfacial sliding in Al thin film: Si substrate systems due to thermal cycling
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1332098
Reference12 articles.
1. Mechanical properties of thin films
2. Mechanical testing of thin films
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5. Role of interfacial and matrix creep during thermal cycling of continuous fiber reinforced metal–matrix composites
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4. Effect of substrate surface on electromigration-induced sliding at hetero-interfaces;Journal of Physics D: Applied Physics;2013-03-18
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