X-ray diffraction analysis of the defect structure in epitaxial GaN
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1314877
Reference20 articles.
1. X-ray diffraction peaks due to misfit dislocations in heteroepitaxial structures
2. The estimation of dislocation densities in metals from X-ray data
3. X‐ray determination of dislocation density in epitaxial ZnCdTe
4. The measurement of threading dislocation densities in semiconductor crystals by X-ray diffraction
5. Role of threading dislocation structure on the x‐ray diffraction peak widths in epitaxial GaN films
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