Versatile atomic force microscopy setup combined with micro-focused X-ray beam
Author:
Affiliation:
1. Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Jungiusstraße 11, D-20355 Hamburg, Germany
2. DESY Photon Science, Notkestraße 85, 22607 Hamburg, Germany
Funder
BMBF
PIER
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4922605
Reference17 articles.
1. Probing the elastic properties of individual nanostructures by combining in situ atomic force microscopy and micro-x-ray diffraction
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4. Combining scanning probe microscopy and x-ray spectroscopy
5. Combining scanning tunneling microscopy and synchrotron radiation for high-resolution imaging and spectroscopy with chemical, electronic, and magnetic contrast
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