An innovative <i>in situ</i> AFM system for a soft X-ray spectromicroscopy synchrotron beamline-Reference-Cited by-同舟云学术

An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline

Published:2024 Issue:3 Volume:149 Page:700-706
ISSN:0003-2654
Container-title:The Analyst
language:en
Short-container-title:Analyst

Author:

Hafner Aljoša¹^ORCID,Costa Luca²^ORCID,Kourousias George¹^ORCID,Bonanni Valentina¹^ORCID,Žižić Milan¹^ORCID,Stolfa Andrea¹,Bazi Benjamin³,Vincze Laszlo³,Gianoncelli Alessandra¹^ORCID

Affiliation:

1. Elettra Sincrotrone Trieste, SS 14 km 163, 5 in Area Science Park, 34149 Basovizza, Trieste, Italy

2. Centre de Biochimie Structurale, CNRS UMR 5048 - UM - INSERM U 1054, 29 rue de Navacelles 34090 Montpellier, France

3. Department of Chemistry, Ghent University, Krijgslaan 281, B-9000 Ghent, Belgium

Abstract

The development of an in situ combination of AFM and soft X-ray μXRF in a single instrument, with AFM integration accomplished without substantial original set-up alteration.

Funder

Universiteit Gent

Agence Nationale de la Recherche

Publisher

Royal Society of Chemistry (RSC)

Subject

Electrochemistry,Spectroscopy,Environmental Chemistry,Biochemistry,Analytical Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2024/AN/D3AN01358H

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5. Atomically precise control of rotational dynamics in charged rare-earth complexes on a metal surface

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