Imaging of charge trapping in distorted carbon nanotubes by x-ray excited scanning probe microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3029725
Reference25 articles.
1. Complementary carbon nanotube-gated carbon nanotube thin-film transistor
2. Exclusive-OR gate with a single carbon nanotube
3. In situmanipulation and electrical characterization of multiwalled carbon nanotubes by using nanomanipulators under scanning electron microscopy
4. Defect-induced electrical conductivity increase in individual multiwalled carbon nanotubes
5. Effect of coiling on the electronic properties along single-wall carbon nanotubes
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