Frequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: The dip-df mode
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4871436
Reference31 articles.
1. Force measurements with the atomic force microscope: Technique, interpretation and applications
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5. True Atomic-Resolution Imaging of (101̅4) Calcite in Aqueous Solution by Frequency Modulation Atomic Force Microscopy
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2. Bottom-tracking: the possibilities and physical meaning of keeping the bottom of the frequency shift in atomic force microscopy;Japanese Journal of Applied Physics;2020-05-29
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