Color atomic force microscopy: A method to acquire three independent potential parameters to generate a color image-Reference-Cited by-同舟云学术

Color atomic force microscopy: A method to acquire three independent potential parameters to generate a color image

Author:

Allain P. E.¹²^ORCID,Damiron D.¹²,Miyazaki Y.²,Kaminishi K.²,Pop F. V.¹²^ORCID,Kobayashi D.²,Sasaki N.³,Kawakatsu H.¹²

Affiliation:

1. LIMMS/CNRS UMI2820 Institute of Industrial Science, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan

2. CIRMM, Institute of Industrial Science, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan

3. Department of Engineering Science, the University of Electro-Communication, 1-5-1 Chofugaoka, Chofu, Tokyo 153-8585, Japan

Funder

University of Tokyo (Utokyo)

Centre National de la Recherche Scientifique (CNRS)

Japan Society for the Promotion of Science London (JSPS London)

Core Research for Evolutional Science and Technology (CREST)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

Reference39 articles.

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