Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1896938
Reference25 articles.
1. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
2. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
3. Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope
4. The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscope
5. Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques
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