Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4922210
Reference23 articles.
1. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
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