Ionization and shielding of interface states in native p+-Si/SiO2 probed by electric field induced second harmonic generation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3000051
Reference33 articles.
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4. Physical model and numerical results of dissociation kinetics of hydrogen-passivated Si/SiO2 interface defects
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