Subject
General Physics and Astronomy
Reference21 articles.
1. Investigation of ion‐implanted GaP layers by ellipsometry
2. Ellipsometric study of 400ev ion damage in silicon
3. Ellipsometric study of silicon implanted with boron ions in low doses
4. D. K. Brice,Ion Implantation Range and Energy Deposition Distributions(IFI∕Plenum, New York, 1971).
5. J. F. Gibbons, W. S. Johnson, and S. W. Mylorie,Projected Range Statistics(Halsted, New York, 1975).
Cited by
12 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献