A novel computer based pseudo‐logarithmic capacitance/conductance DLTS system specifically designed for transient analysis
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1143356
Reference33 articles.
1. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
2. A microcomputer based deep level transient spectroscopy system
3. Fast computer‐controlled deep level transient spectroscopy system for versatile applications in semiconductors
4. A computer controlled system for transient capacitance measurements of deep levels in semiconductor
5. Simple microcomputer‐based apparatus for combined DLTS–C‐V measurement
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