Temperature dependence of optical properties of GaAs
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.349285
Reference22 articles.
1. Variable angle of incidence spectroscopic ellipsometry: Application to GaAs‐AlxGa1−xAs multiple heterostructures
2. Ellipsometric measurements of molecular‐beam‐epitaxy‐grown semiconductor multilayer thicknesses: A comparative study
3. Variable angle spectroscopic ellipsometry: Application to GaAs‐AlGaAs multilayer homogeneity characterization
4. Insitumonitoring by ellipsometry of metalorganic epitaxy of GaAlAs‐GaAs superlattice
5. Chemical and structural analysis of the GaAs/AlGaAs heterojunctions by spectroscopic ellipsometry
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