Self‐Healing Breakdown Measurements of Pyrolytic Aluminum Oxide Films on Silicon
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1659779
Reference13 articles.
1. The maximum dielectric strength of thin silicon oxide films
2. The mechanism of self-healing electrical breakdown in MOS structures
3. Vacuum-deposited thin-film capacitors of silicon monoxide
4. Electrical breakdown of M.O.S. structures and its dependence upon the oxidation process†
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