Automated real-time study of the defect-induced breakdown occurring on a film–electrode system under a high electric field-Reference-Cited by-同舟云学术

Automated real-time study of the defect-induced breakdown occurring on a film–electrode system under a high electric field

Author:

Hu Dengyan¹²^ORCID,Chen Jianwen¹^ORCID,Zhu Wenbo²^ORCID,Huang Suilong²^ORCID,Chen Wenjun¹^ORCID,Wang Jinhai¹,Wang Xiucai³,Xiao Peng⁴

Affiliation:

1. School of Electronic and Information Engineering, Foshan University, Foshan 528000, China

2. School of Mechatronic Engineering and Automation, Foshan University, Foshan 528000, China

3. School of Materials Science and Hydrogen Energy, Foshan University,Foshan 528000, China

4. School of Physics and Optoelectronic Engineering, Foshan University, Foshan 528000, China

Funder

Youth Project of Guangdong Foshan Joint Fund of Guangdong Natural Science Foundation

Joint Funds of Basic and Applied Basic Research Foundation of Department of Science and Technology of Guangdong Province of China

National Natural Science Foundation of China

Research Fund of Guangdong-Hong Kong-Macao Joint Laboratory for Intelligent Micro-Nano Optoelectronic Technology

The Guangdong Basic and Applied Basic Research Foundation

Publisher

AIP Publishing

Subject

Instrumentation

Link

Reference29 articles.

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