Growth of ultrahigh-density quantum-confined germanium dots on SiO2 thin films
Author:
Affiliation:
1. L2MP UMR CNRS 6137, Polytech Marseille-Technopole de Château Gombert, 13451 Marseille Cedex 20, France
2. Dipartimento di Fisica, Unita’ CNISM, Universita’ di Roma Tor Vergata, 00133 Roma, Italy
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Reference34 articles.
1. M. Fukuda, Optical Semiconductor Devices (Wiley, New York, 1999).
2. Jan De Blauwe, IEEE Trans. Nanotechnol.1536-125X 1, 72 (2002);
3. Traps in germanium nanocrystal memory and effect on charge retention: Modeling and experimental measurements
4. Electrical study of Ge-nanocrystal-based metal-oxide-semiconductor structures for p-type nonvolatile memory applications
5. Photoluminescence study of the crossover from two‐dimensional to three‐dimensional growth for Ge on Si(100)
Cited by 33 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Coatings consisting of Ge particles on nonwettable Si oxide surfaces and their resonance reflection spectra;Thin Solid Films;2023-03
2. Spectro-ellipsometric probing of wetting, nucleation, and dot/island formation during photo-excited chemical vapor deposition of Ge on SiO2 substrate;Journal of Vacuum Science & Technology B;2022-12
3. Spectro-ellipsometric modeling and optimization of two-dimensional Ge layer and three-dimensional Ge dot/island structures on SiO2 substrates;Japanese Journal of Applied Physics;2021-01-01
4. Structural and photoluminescence study of TiO2 layer with self-assembled Si1−xGex nanoislands;Journal of Applied Physics;2020-08-28
5. Dewetting behavior of Ge layers on SiO2 under annealing;Scientific Reports;2020-08-13
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3