Capacitance transient spectroscopy in metal-insulator-metal systems and its application to the determination of trap parameters in polyimide films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.369233
Reference16 articles.
1. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
2. Deep-level-transient spectroscopy: System effects and data analysis
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4. High-field induced electrical aging in polypropylene films
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