Deep-level-transient spectroscopy: System effects and data analysis
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Reference6 articles.
1. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
2. New Developments in Defect Studies in Semiconductors
3. A correlation method for semiconductor transient signal measurements
4. Capacitance Transient Spectroscopy
5. J. T. Schott, H. M. Deangelis, and W. R. White, Air Force Cambridge Research Laboratories Report No. AFCRL-TR-76-0024, 1976.
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