Degradation and recovery of polarization under synchrotron x rays in SrBi2Ta2O9 ferroelectric capacitors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1851598
Reference30 articles.
1. Ferroelectric Memories
2. Polarization fatigue in ferroelectric films: Basic experimental findings, phenomenological scenarios, and microscopic features
3. Lifetime estimation due to imprint failure in ferroelectric SrBi2Ta2O9 thin films
4. Photoinduced changes in the fatigue behavior of SrBi2Ta2O9and Pb(Zr,Ti)O3thin films
5. Voltage offsets and imprint mechanism in SrBi2Ta2O9thin films
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