Lifetime estimation due to imprint failure in ferroelectric SrBi2Ta2O9 thin films
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.125755
Reference16 articles.
1. Fatigue-free ferroelectric capacitors with platinum electrodes
2. Preparation and ferroelectric properties of SrBi2Ta2O9 thin films
3. Imprint in Ferroelectric Capacitors
4. Internal bias in ferroelectric ceramics: Origin and time dependence
5. Origin of Imprint in Ferroelectric CSD SrBi2Ta2O9 Thin Films
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