Optical deep level transient spectroscopy of minority carrier traps in n-type high-purity germanium
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.365219
Reference13 articles.
1. Fast capacitance transient appartus: Application to ZnO and O centers in GaP p‐n junctions
2. Deep Level Transient Spectroscopy of High-Purity Germanium Diodes/Detectors
3. Signature and capture cross section of copper-related hole traps in p-type high-purity germanium
4. Correlation between DLTS-Measurements and the Performance of High Purity Germanium Detectors
5. Correlation between deep-level parameters and energy resolution of p-type high purity Ge γ-detectors
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